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Number of items: 3.


Khursheed, Saqib, Al-Hashimi, Bashir M, Reddy, Sudhakar M and Harrod, Peter
(2009) Diagnosis of Multiple-Voltage Design With Bridge Defect. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28 (3). 406 - 416.


Khursheed, Saqib, Al-Hashimi, Bashir M, Chakrabarty, Krishnendu and Harrod, Peter
(2010) Gate-Sizing-Based Single V-dd Test for Bridge Defects in Multivoltage Designs. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 29 (9). 1409 - 1421.


Ingelsson, Urban, Al-Hashimi, Bashir M, Khursheed, Saqib, Reddy, Sudhakar M and Harrod, Peter
(2009) Process Variation-Aware Test for Resistive Bridges. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28 (8). 1269 - 1274.

This list was generated on Sun Nov 17 08:26:41 2019 GMT.