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Khursheed, Saqib, Al-Hashimi, Bashir M, Reddy, Sudhakar M and Harrod, Peter
(2009)
Diagnosis of Multiple-Voltage Design With Bridge Defect.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28 (3).
pp. 406-416.
Narang, Anuraag 
ORCID: 0000-0001-8033-1261, Venu, Balaji, Khursheed, Syed-Saqib and Harrod, Peter
(2021)
An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults.
In: 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021-10-6 - 2021-10-8.
Khursheed, Saqib, Al-Hashimi, Bashir M, Chakrabarty, Krishnendu and Harrod, Peter
(2010)
Gate-Sizing-Based Single V<sub>dd</sub> Test for Bridge Defects in Multivoltage Designs.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 29 (9).
pp. 1409-1421.
Ingelsson, Urban, Al-Hashimi, Bashir M, Khursheed, Saqib, Reddy, Sudhakar M and Harrod, Peter
(2009)
Process Variation-Aware Test for Resistive Bridges.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28 (8).
pp. 1269-1274.