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Chai, Zheng, Zhang, Weidong, Freitas, Pedro, Hatem, Firas, Zhang, Jian Fu, Marsland, John, Govoreanu, Bogdan, Goux, Ludovic, Kar, Gouri Sankar, Hall, Steve ORCID: 0000-0001-8387-1036
et al (show 2 more authors) (2018) The Over-Reset Phenomenon in Ta2O5 RRAM Device Investigated by the RTN-Based Defect Probing Technique. IEEE ELECTRON DEVICE LETTERS, 39 (7). 955 - 958.

This list was generated on Mon Nov 4 11:45:30 2019 GMT.