Browse by People


Up a level
Export as [feed] RSS [feed] RSS 2.0 Short Author List
Number of items: 5.


Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Althobaiti, M, Hesp, D, Dhanak, VR, Santoni, A, Weerakkody, AD, Sedghi, N ORCID: 0000-0002-2004-6159, Chalker, PR ORCID: 0000-0002-2295-6332, Henkel, C
et al (show 5 more authors) (2015) Atomic-layer deposited thulium oxide as a passivation layer on germanium. JOURNAL OF APPLIED PHYSICS, 117 (21).


Shaw, A, Whittles, TJ ORCID: 0000-0002-5154-7511, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Jin, JD, Wrench, JS, Hesp, D, Dhanak, VR, Chalker, PR ORCID: 0000-0002-2295-6332 and Hall, S ORCID: 0000-0001-8387-1036
(2015) Physical and Electrical Characterization of Mg-Doped ZnO Thin-Film Transistors. .


Supardan, S, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hesp, D, Dhanak, VR, Hall, S ORCID: 0000-0001-8387-1036, Schamm-Chardon, S, Dentoni Litta, E, Hellstrom, P-E and Ostling, M
(2016) Rare-earth oxide interfacial layer for sub-nm EOT CMOS technology. In: 3rd International Conference on Nanotechnology, Nanomaterials and Thin Films for Energy Applications, 2016-07-27 - 2016-07-29, University of Liverpool.


Mitrovic, IZ ORCID: 0000-0003-4816-8905, Supardan, SN, Hesp, D, Dhanak, VR, Hall, S ORCID: 0000-0001-8387-1036, Schamm-Chardon, S, Dentoni Litta, E, Hellstrom, P-E and Ostling, M
(2016) Structure of the interface in sub-nm EOT TmSiO/HfO2 gate stack. In: 19th Workshop on Dielectrics in Microelectronics –WODIM 2016, 2016-06-27 - 2016-06-30, Catania, Italy.


Smerdon, JA, Young, KM, Lowe, M, Hars, SS, Yadav, TP, Hesp, D, Dhanak, VR, Tsai, AP, Sharma, HR ORCID: 0000-0003-0456-6258 and McGrath, R ORCID: 0000-0002-9880-5741
(2014) Templated Quasicrystalline Molecular Ordering. NANO LETTERS, 14 (3). 1184 - 1189.

This list was generated on Wed Nov 20 02:34:32 2019 GMT.