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Shen, ZJ, Zhao, C, Zhao, CZ, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Yang, L, Xu, WY, Lim, EG ORCID: 0000-0003-0199-7386, Luo, T, Huang, YB and IEEE,
(2019) Al/GO/Si/Al RRAM with Solution-processed GO dielectric at Low Fabrication Temperature. .

Qi, YF, Shen, ZJ, Zhao, Chun, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Xu, WY, Lim, EG ORCID: 0000-0003-0199-7386, Yang, L, He, JH, Luo, T, Huang, YB
et al (show 1 more authors) (2020) Resistive switching behavior of solution-processed AlOx and GO based RRAM at low temperature. SOLID-STATE ELECTRONICS, 168.

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