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Shen, ZJ, Zhao, C, Zhao, CZ, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Yang, L, Xu, WY, Lim, EG, Luo, T and Huang, YB
(2019) Al/GO/Si/ Al RRAM with Solution-processed GO dielectric at Low Fabrication Temperature. In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2019-04-01 - 2019-04-03.

Qi, YF, Shen, ZJ, Zhao, Chun, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Xu, WY, Lim, EG, Yang, L, He, JH, Luo, T, Huang, YB
et al (show 1 more authors) (2020) Resistive switching behavior of solution-processed AlOx and GO based RRAM at low temperature. Solid-State Electronics, 168. 107735 - 107735.

This list was generated on Sat May 9 23:12:05 2020 BST.