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Shen, ZJ, Zhao, C, Zhao, CZ, Mitrovic, IZ 
ORCID: 0000-0003-4816-8905, Yang, L, Xu, WY, Lim, EG ORCID: 0000-0003-0199-7386, Luo, T and Huang, YB
(2019)
Al/GO/Si/Al RRAM with Solution-processed GO dielectric at Low Fabrication Temperature.
In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2019-4-1 - 2019-4-3, Grenoble, France.
Qi, YF, Shen, ZJ, Zhao, Chun, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Xu, WY, Lim, EG ORCID: 0000-0003-0199-7386, Yang, L, He, JH, Luo, T, Huang, YB et al (show 1 more authors)
(2020)
Resistive switching behavior of solution-processed AlO<sub>x</sub> and GO based RRAM at low temperature.
SOLID-STATE ELECTRONICS, 168.
p. 107735.