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Kalanadhabhatta, Srisubha, Dutt, Rashi, Khursheed, Saqib, Acharyya, Amit and IEEE,
(2021)
IC age estimation methodology using IO pad protection diodes for prevention of Recycled ICs.
In: 2021 IEEE International Symposium on Circuits and Systems (ISCAS), 2021-5-22 - 2021-5-28.
Kalanadhabhatta, Srisubha, Anumandla, Kiran Kumar, Khursheed, Saqib and Acharyya, Amit
(2020)
Secure Scan Design with a Novel Methodology of Scan Camouflaging.
In: 2020 European Conference on Circuit Theory and Design (ECCTD), 2020-9-7 - 2020-9-10, Sofia, Bulgaria.