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Number of items: 4.


Alnuayri, Turki ORCID: 0000-0002-6884-4053, Khursheed, Syed-Saqib, Hernández Martínez, AL and Rossi, Daniele
(2021) Differential Aging Sensor using Sub-threshold Leakage Current to Detect Recycled ICs. IEEE Transactions on Very Large Scale Integration Systems, 29 (12). pp. 2064-2075.


Narang, Anuraag ORCID: 0000-0001-8033-1261, Venu, Balaji, Khursheed, Syed-Saqib and Harrod, Peter
(2021) An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults. In: 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021-10-6 - 2021-10-8.


Piliposyan, Gor ORCID: 0000-0001-7182-0717 and Khursheed, Syed-Saqib
(2022) PCB Hardware Trojan Run-time Detection Through Machine Learning. IEEE Transactions on Computers, 72 (7). pp. 1958-1970.


Yousuf, Sofia, Khan, Salman and Khursheed, Syed-Saqib
(2022) Remaining Useful Life (RUL) Regression Using Long-Short Term Memory (LSTM) Networks. Microelectronics Reliability, 139. p. 114772.

This list was generated on Sat Mar 30 03:02:22 2024 GMT.