 | Up a level |
Murooka, Yoshie, Bryan, William, Clarke, James, Ellis, Michael, Kirkland, Angus I, Maskell, Simon 
ORCID: 0000-0003-1917-2913, McKenzie, Julian, Layla Mehdi, B, Dwayne Miller, RJ, Noakes, Timothy CQ et al (show 5 more authors)
(2023)
The Design of Relativistic Ultrafast Electron Diffraction and Imaging (RUEDI) Facility for Materials in Extremes.
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29 (Supple).
pp. 1487-1488.
Robinson, Alex W ORCID: 0000-0002-1901-2509, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Wells, Jack, Nicholls, Daniel ORCID: 0000-0003-1677-701X, Broad, Zoe, Kirkland, Angus I, Mehdi, Beata L and Browning, Nigel D ORCID: 0000-0003-0491-251X
(2023)
In silico Ptychography of Lithium-ion Cathode Materials from Subsampled
4-D STEM Data.
[Preprint]
Robinson, Alex W ORCID: 0000-0002-1901-2509, Nicholls, Daniel ORCID: 0000-0003-1677-701X, Wells, Jack, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Kirkland, Angus I and Browning, Nigel D ORCID: 0000-0003-0491-251X
(2022)
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM
Simulation.
[Preprint]
Nicholls, Daniel ORCID: 0000-0003-1677-701X, Wells, Jack, Robinson, Alex W ORCID: 0000-0002-1901-2509, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Kobylynska, Maryna, Fleck, Roland A, Kirkland, Angus I and Browning, Nigel D ORCID: 0000-0003-0491-251X
(2022)
A Targeted Sampling Strategy for Compressive Cryo Focused Ion Beam
Scanning Electron Microscopy.
[Preprint]
Browning, Nigel D ORCID: 0000-0003-0491-251X, Castagna, Jony, Kirkland, Angus I, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Nicholls, Daniel ORCID: 0000-0003-1677-701X, Robinson, Alex W ORCID: 0000-0002-1901-2509, Wells, Jack and Zheng, Yalin ORCID: 0000-0002-7873-0922
(2023)
The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy.
APPLIED PHYSICS LETTERS, 122 (5).
050501-050501.