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Sun, Youcheng, Wu, Min, Ruan, Wenjie, Huang, Xiaowei 
ORCID: 0000-0001-6267-0366, Kwiatkowska, Marta and Kroening, Daniel
(2018)
Concolic Testing for Deep Neural Networks.
In: 33rd IEEE/ACM International Conference on Automated Software Engineering, 2018-9-3 - 2018-9-7, Montpellier, France.
Chatterjee, Krishnendu, Ibsen-Jensen, Rasmus and Pavlogiannis, Andreas
(2015)
Faster Algorithms for Quantitative Verification in Constant Treewidth Graphs.
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Sun, Youcheng, Huang, Xiaowei ORCID: 0000-0001-6267-0366, Kroening, Daniel, Sharp, James, Hill, Matthew and Ashmore, Rob
(2019)
Structural Test Coverage Criteria for Deep Neural Networks.
2019 IEEE/ACM 41ST INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING: COMPANION PROCEEDINGS (ICSE-COMPANION 2019).
pp. 320-321.
Sun, Youcheng, Huang, Xiaowei ORCID: 0000-0001-6267-0366, Kroening, Daniel, Sharp, James, Hill, Matthew and Ashmore, Rob
(2019)
Structural Test Coverage Criteria for Deep Neural Networks.
ACM Transactions on Embedded Computing Systems, 18 (5S).
pp. 1-23.
Huang, Xiaowei ORCID: 0000-0001-6267-0366, Kroening, Daniel, Ruan, Wenjie, Sharp, James, Sun, Youcheng, Thamo, Emese, Wu, Min and Yi, Xinping ORCID: 0000-0001-5163-2364
(2020)
A survey of safety and trustworthiness of deep neural networks: Verification, testing, adversarial attack and defence, and interpretability?
COMPUTER SCIENCE REVIEW, 37.
p. 100270.