![]() | Up a level |
Number of items: 1.
Haslinger, SG ORCID: 0000-0003-0790-1701, Lowe, MJS, Craster, RV, Huthwaite, P and Shi, F
(2021)
Prediction of reflection amplitudes for ultrasonic inspection of rough planar defects.
INSIGHT, 63 (1).
pp. 28-36.