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Number of items: 2.
Shen, Zongjie, Qi, Yanfei, Mitrovic, Ivona Z 
ORCID: 0000-0003-4816-8905, Zhao, Cezhou, Hall, Steve ORCID: 0000-0001-8387-1036, Yang, Li, Luo, Tian, Huang, Yanbo and Zhao, Chun
(2019)
Effect of Annealing Temperature for Ni/AlO<sub>x</sub>/Pt RRAM Devices Fabricated with Solution-Based Dielectric.
MICROMACHINES, 10 (7).
E446-.
Shen, Zongjie, Qi, Yanfei, Mitrovic, Ivona Z, Zhao, Cezhou ORCID: 0000-0002-4783-960X, Hall, Steve, Yang, Li, Luo, Tian, Huang, Yanbo and Zhao, Chun ORCID: 0000-0002-4783-960X
(2019)
Effect of Annealing Temperature for Ni/AlOx/Pt RRAM Devices Fabricated with Solution-Based Dielectric.
Micromachines, 10 (7).