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Hu, Yihua ORCID: 0000-0002-1007-1617, Cao, Wenping, Ma, Jien, Finney, Stephen J and Li, David
(2014) Identifying PV Module Mismatch Faults by a Thermography-Based Temperature Distribution Analysis. IEEE Transactions on Device and Materials Reliability, 14 (4). pp. 951-960.

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