 | Up a level |
Number of items: 2.
Abes, M, Koops, CT, Hrkac, SB, McCord, J, Urs, NO, Wolff, N, Kienle, L, Ren, WJ, Bouchenoire, L, Murphy, BM et al (show 1 more authors)
(2016)
Domain structure and reorientation in CoFe<sub>2</sub>O<sub>4</sub>.
PHYSICAL REVIEW B, 93 (19).
195427-.
Gruender, Y 
ORCID: 0000-0002-5295-0927, Stettner, J and Magnussen, OM
(2018)
Review-In-Situ Surface X-ray Diffraction Studies of Copper Electrodes: Atomic-Scale Interface Structure and Growth Behavior.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 166 (1).
D3049-D3057.