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Maji, S, Samanta, S, Das, P ORCID: 0000-0003-1147-6541, Maikap, S, Dhanak, VR ORCID: 0000-0001-8053-654X, Mitrovic, IZ ORCID: 0000-0003-4816-8905 and Mahapatra, R
(2019)
Set compliance current induced resistive memory characteristics of W/Hf/HfOx/TiN devices.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 37 (2).
021204-1-021204-7.