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Number of items: 1.
Khursheed, S, Vivet, P, Hopsch, F and Marinissen, EJ
(2016)
Guest Editors' Introduction: Robust 3-D Stacked ICs.
IEEE Design & Test, 33 (3).
6 - 7.
ISSN 2168-2356, 2168-2364
Up a level |
Khursheed, S, Vivet, P, Hopsch, F and Marinissen, EJ
(2016)
Guest Editors' Introduction: Robust 3-D Stacked ICs.
IEEE Design & Test, 33 (3).
6 - 7.
ISSN 2168-2356, 2168-2364
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