 | Up a level |
Mu, Y, Zhao, CZ, Lu, Q, Zhao, C, Qi, Y, Lam, S, Mitrovic, IZ 
ORCID: 0000-0003-4816-8905, Taylor, S ORCID: 0000-0002-2144-8459 and Chalker, PR ORCID: 0000-0002-2295-6332
(2017)
Effects of biased irradiation on charge trapping in HfO<inf>2</inf> dielectric thin films.
In: INTERNATIONAL CONFERENCE “FUNCTIONAL ANALYSIS IN INTERDISCIPLINARY APPLICATIONS” (FAIA2017).
Lu, Q, Mu, Y, Zhao, Y, Zhao, CZ, Taylor, S ORCID: 0000-0002-2144-8459 and Chalker, PR
(2017)
Investigation of the electrical performance of hfo<sub>2</sub> dielectrics deposited on passivated germanium substrates.
.
Mu, Y, Zhao, CZ, Qi, Y, Lam, S, Zhao, C, Lu, Q, Cai, Y, Mitrovic, IZ, Taylor, S and Chalker, PR
(2016)
Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 372.
14 - 28.
ISSN 0168-583X
Mu, Y
(2017)
Total Ionizing Dose Response of High-k Dielectrics on MOS Devices.
Doctor of Philosophy thesis, University of Liverpool.