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Narwariya, Anmol, Das, Pabitra, Khursheed, Syed-Saqib and Acharyya, Amit
(2022)
Operational Age Estimation of ICs using Gaussian Process Regression.
In: 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems., 2022-10-19 - 2022-9-21, Austin, TX, USA.