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Wong, Hay 
ORCID: 0000-0003-1717-2653, Neary, Derek, Jones, Eric, Fox, Peter ORCID: 0000-0003-3442-8630 and Sutcliffe, Chris
(2019)
Benchmarking spatial resolution in electronic imaging for potential in-situ Electron Beam Melting monitoring.
ADDITIVE MANUFACTURING, 29.
p. 100829.
Wong, Hay ORCID: 0000-0003-1717-2653, Neary, Derek, Jones, Eric, Fox, Peter ORCID: 0000-0003-3442-8630 and Sutcliffe, Chris
(2019)
Pilot capability evaluation of a feedback electronic imaging system prototype for in-process monitoring in electron beam additive manufacturing.
INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 100 (1-4).
pp. 707-720.
Wong, Hay ORCID: 0000-0003-1717-2653, Neary, Derek, Jones, Eric, Fox, Peter ORCID: 0000-0003-3442-8630 and Sutcliffe, Chris
(2019)
Pilot feedback electronic imaging at elevated temperatures and its potential for in-process electron beam melting monitoring.
ADDITIVE MANUFACTURING, 27.
pp. 185-198.
Wong, Hay ORCID: 0000-0003-1717-2653, Neary, Derek, Shahzad, Sohail, Jones, Eric, Fox, Peter ORCID: 0000-0003-3442-8630 and Sutcliffe, Chris
(2019)
Pilot investigation of feedback electronic image generation in electron beam I melting and its potential for in-process monitoring.
JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 266.
pp. 502-517.