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Benoit, M, de Mendizabal, J Bilbao, Casse, G ORCID: 0000-0002-8516-237X, Chen, H, Chen, K, Di Bello, FA, Ferrere, D, Golling, T, Gonzalez-Sevilla, S, Iacobucci, G et al (show 15 more authors) , Lanni, F, Liu, H, Meloni, F, Meng, L ORCID: 0000-0002-2901-6589, Miucci, A, Muenstermann, D, Nessi, M, Peric, I, Rimoldi, M, Ristic, B, Pinto, M Vicente Barrero, Vossebeld, J, Weber, M, Wu, W and Xu, L (2016) Results of the 2015 testbeam of a 180nm AMS High-Voltage CMOS sensor prototype. JOURNAL OF INSTRUMENTATION, 11 (07). P07019-P07019.

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Benoit, M, Braccini, LS, Casanova, R, Cavallaro, E, Chen, HH, Chen, K, Di Bell, DFA, Ferrere, D, Frizzell, D, Golfing, T et al (show 27 more authors) , Gonzalez-Sevilla, S, Grinstein, S, Lacobucci, G, Kiehn, M, Lanni, F, Liu, H, Metcalfe, J, Meng, L, Merlassino, C, Miucci, A, Muenstermann, D, Nessi, M, Okawa, H, Peric, I, Rimoldi, M, Ristic, B, Sultan, DMS, Terzo, S, Pinto, M Vicente Barrero, Figueras, E Vilella, Weber, M, Weston, T, Wu, W, Xie, J, Xu, L, Zaffaroni, E and Zhang, M (2018) Test beam measurement of ams H35 HV-CMOS capacitively coupled pixel sensor prototypes with high-resistivity substrate. JOURNAL OF INSTRUMENTATION, 13 (12). P12009-P12009.

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Benoit, M, Braccini, S, Casse, G ORCID: 0000-0002-8516-237X, Chen, H, Chen, K, Di Bello, FA, Ferrere, D, Golling, T, Gonzalez-Sevilla, S, Iacobucci, G et al (show 19 more authors) , Kiehn, M, Lanni, F, Liu, H, Meng, L ORCID: 0000-0002-2901-6589, Merlassino, C, Miucci, A, Muenstermann, D, Nessi, M, Okawa, H, Peric, I, Rimoldi, M, Ristic, B, Pinto, M Vicente Barrero, Vossebeld, J, Weber, M, Weston, T, Wu, W, Xu, L and Zaffaroni, E (2018) Testbeam results of irradiated ams H18 HV-CMOS pixel sensor prototypes. JOURNAL OF INSTRUMENTATION, 13 (02). P02011-.