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Mu, Y, Zhao, CZ, Lu, Q, Zhao, C, Qi, Y, Lam, S, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Taylor, S ORCID: 0000-0002-2144-8459 and Chalker, PR ORCID: 0000-0002-2295-6332
(2017) Effects of biased irradiation on charge trapping in HfO<inf>2</inf> dielectric thin films. .

Mu, Y, Zhao, CZ, Qi, Y, Lam, S, Zhao, C, Lu, Q, Cai, Y, Mitrovic, IZ, Taylor, S and Chalker, PR
(2016) Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 372. 14 - 28. ISSN 0168-583X

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