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Beni, A, Ott, N, Pawelkiewicz, M, Wardé, M, Young, K, Bauer, B, Rajput, P, Zegenhagen, J, McGrath, R ORCID: 0000-0002-9880-5741, Barthés-Labrousse, MG
et al (show 2 more authors) (2014) Hard X -Ray Photoelectron Spectroscopy (HAXPES) characterisation of electrochemical passivation oxide layers on Al-Cr-Fe Complex Metallic Alloys (CMA). Electrochemistry Communications, 46. pp. 13-17.

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