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Robinson, Alex W ORCID: 0000-0002-1901-2509, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Wells, Jack, Nicholls, Daniel, Broad, Zoe, Kirkland, Angus I, Mehdi, Beata L and Browning, Nigel D ORCID: 0000-0003-0491-251X
(2023)
In silico Ptychography of Lithium-ion Cathode Materials from Subsampled
4-D STEM Data.
[Preprint]
Robinson, Alex W ORCID: 0000-0002-1901-2509, Nicholls, Daniel ORCID: 0000-0003-1677-701X, Wells, Jack, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Kirkland, Angus I and Browning, Nigel D ORCID: 0000-0003-0491-251X
(2022)
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM
Simulation.
[Preprint]
Robinson, Alex W ORCID: 0000-0002-1901-2509, Nicholls, Daniel ORCID: 0000-0003-1677-701X, Wells, Jack, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Kirkland, Angus and Browning, Nigel D ORCID: 0000-0003-0491-251X
(2022)
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation.
ULTRAMICROSCOPY, 242.
113625-.
Broad, Zoë, Nicholls, Daniel, Wells, Jack, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Robinson, Alex W ORCID: 0000-0002-1901-2509, Masters, Robert, Hughes, Louise and Browning, Nigel D
(2023)
Subsampling Methods for Fast Electron Backscattered Diffraction Analysis for SEM.
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29 (Supple).
pp. 467-469.
Nicholls, Daniel ORCID: 0000-0003-1677-701X, Wells, Jack, Robinson, Alex W ORCID: 0000-0002-1901-2509, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Kobylynska, Maryna, Fleck, Roland A, Kirkland, Angus I and Browning, Nigel D ORCID: 0000-0003-0491-251X
(2022)
A Targeted Sampling Strategy for Compressive Cryo Focused Ion Beam
Scanning Electron Microscopy.
[Preprint]
Browning, Nigel D ORCID: 0000-0003-0491-251X, Castagna, Jony, Kirkland, Angus I, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Nicholls, Daniel ORCID: 0000-0003-1677-701X, Robinson, Alex W ORCID: 0000-0002-1901-2509, Wells, Jack and Zheng, Yalin ORCID: 0000-0002-7873-0922
(2023)
The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy.
APPLIED PHYSICS LETTERS, 122 (5).
050501-050501.