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Number of items: 6.


Robinson, Alex W ORCID: 0000-0002-1901-2509, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Wells, Jack, Nicholls, Daniel, Broad, Zoe, Kirkland, Angus I, Mehdi, Beata L and Browning, Nigel D ORCID: 0000-0003-0491-251X
(2023) In silico Ptychography of Lithium-ion Cathode Materials from Subsampled 4-D STEM Data. [Preprint]


Robinson, Alex W ORCID: 0000-0002-1901-2509, Nicholls, Daniel ORCID: 0000-0003-1677-701X, Wells, Jack, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Kirkland, Angus I and Browning, Nigel D ORCID: 0000-0003-0491-251X
(2022) SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation. [Preprint]


Robinson, Alex W ORCID: 0000-0002-1901-2509, Nicholls, Daniel ORCID: 0000-0003-1677-701X, Wells, Jack, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Kirkland, Angus and Browning, Nigel D ORCID: 0000-0003-0491-251X
(2022) SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation. ULTRAMICROSCOPY, 242. 113625-.


Broad, Zoë, Nicholls, Daniel, Wells, Jack, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Robinson, Alex W ORCID: 0000-0002-1901-2509, Masters, Robert, Hughes, Louise and Browning, Nigel D
(2023) Subsampling Methods for Fast Electron Backscattered Diffraction Analysis for SEM. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29 (Supple). pp. 467-469.


Nicholls, Daniel ORCID: 0000-0003-1677-701X, Wells, Jack, Robinson, Alex W ORCID: 0000-0002-1901-2509, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Kobylynska, Maryna, Fleck, Roland A, Kirkland, Angus I and Browning, Nigel D ORCID: 0000-0003-0491-251X
(2022) A Targeted Sampling Strategy for Compressive Cryo Focused Ion Beam Scanning Electron Microscopy. [Preprint]


Browning, Nigel D ORCID: 0000-0003-0491-251X, Castagna, Jony, Kirkland, Angus I, Moshtaghpour, Amirafshar ORCID: 0000-0002-6751-2698, Nicholls, Daniel ORCID: 0000-0003-1677-701X, Robinson, Alex W ORCID: 0000-0002-1901-2509, Wells, Jack and Zheng, Yalin ORCID: 0000-0002-7873-0922
(2023) The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy. APPLIED PHYSICS LETTERS, 122 (5). 050501-050501.

This list was generated on Sat Dec 30 17:49:27 2023 GMT.