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Number of items: 2.
Rossi, D, Tenentes, V, Khursheed, S and Reddy, S
(2018)
Recycled IC Detection through Aging Sensor.
In: European Test Symposium, 2018-5-28 - 2018-6-1.
Rossi, D, Tenentes, V, Yang, S, Khursheed, S and Al-Hashimi, BM
(2016)
Reliable Power Gating With NBTI Aging Benefits.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 24 (8).
pp. 2735-2744.