Up a level |
Rossi, Daniele, Tenentes, Vasileios, Yang, Sheng, Khursheed, Saqib and Al-Hashimi, Bashir M
(2017)
Aging Benefits in Nanometer CMOS Designs.
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 64 (3).
pp. 324-328.
Tenentes, Vasileios, Rossi, Daniele, Yang, Sheng, Khursheed, S, Al-Hashimi, BM and Gunn, Steve R
(2017)
Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure.
IEEE Transactions on Very Large Scale Integration Systems, 25 (4).
pp. 1397-1407.
Tenentes, Vasileios, Khursheed, Saqib, Rossi, Daniele, Yang, Sheng and Al-Hashimi, Bashir M
(2015)
DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 34 (12).
pp. 2013-2024.
Tenentes, Vasileios, Rossi, Daniele, Khursheed, S Saqib, Al-Hashimi, Bashir M and Chakrabarty, Krishnendu
(2018)
Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs.
IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems, 37 (4).
pp. 883-895.