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Wong, Hay ORCID: 0000-0003-1717-2653, Neary, Derek, Jones, Eric, Fox, Peter ORCID: 0000-0003-3442-8630 and Sutcliffe, Chris (2019) Benchmarking spatial resolution in electronic imaging for potential in-situ Electron Beam Melting monitoring. ADDITIVE MANUFACTURING, 29. p. 100829.

Wong, Hay ORCID: 0000-0003-1717-2653 (2020) Bitmap generation from computer-aided design for potential layer-quality evaluation in electron beam additive manufacturing. Rapid Prototyping Journal, 26 (5). pp. 941-950.

Tan, Yuanfu and Wong, Hay ORCID: 0000-0003-1717-2653 (2023) Development of a novel beam profiling prototype with laser self-mixing via the knife-edge approach. In: Laser Beam Shaping XXIII, 2023-8-20 - 2023-8-25.

Lin, Feng, Ali, Mubasher, Tan, Yuanfu, Su, Zhou and Wong, Hay ORCID: 0000-0003-1717-2653 (2023) Laser offline measurement method based on self-mixing interference for thin-wall fused deposition modelling component. JOURNAL OF MANUFACTURING PROCESSES, 102. pp. 131-142.

Wong, Hay ORCID: 0000-0003-1717-2653, Garrard, Rebecca, Black, Kate ORCID: 0000-0003-3638-6518, Fox, Peter ORCID: 0000-0003-3442-8630 and Sutcliffe, Chris (2020) Material characterisation using electronic imaging for Electron Beam Melting process monitoring. MANUFACTURING LETTERS, 23. pp. 44-48.

Wong, Hay ORCID: 0000-0003-1717-2653, Neary, Derek, Jones, Eric, Fox, Peter ORCID: 0000-0003-3442-8630 and Sutcliffe, Chris (2019) Pilot capability evaluation of a feedback electronic imaging system prototype for in-process monitoring in electron beam additive manufacturing. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 100 (1-4). pp. 707-720.

Ali, Mubasher, Tan, Yuanfu, Lin, Feng, Su, Zhou, Liao, Wei-Hsin and Wong, Hay ORCID: 0000-0003-1717-2653 (2024) Pilot design of experiment study: effect of stirring duration and guest particle loading on electrostatic adsorption of Ti-6Al-4V composite powder formation. The International Journal of Advanced Manufacturing Technology, 130 (3-4). pp. 1949-1967.

Wong, Hay ORCID: 0000-0003-1717-2653, Neary, Derek, Jones, Eric, Fox, Peter ORCID: 0000-0003-3442-8630 and Sutcliffe, Chris (2019) Pilot feedback electronic imaging at elevated temperatures and its potential for in-process electron beam melting monitoring. ADDITIVE MANUFACTURING, 27. pp. 185-198.

Wong, Hay ORCID: 0000-0003-1717-2653, Neary, Derek, Shahzad, Sohail, Jones, Eric, Fox, Peter ORCID: 0000-0003-3442-8630 and Sutcliffe, Chris (2019) Pilot investigation of feedback electronic image generation in electron beam I melting and its potential for in-process monitoring. JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 266. pp. 502-517.

Wong, Hay ORCID: 0000-0003-1717-2653 (2020) Pilot investigation of surface-tilt and gas amplification induced contrast during electronic imaging for potential in-situ electron beam melting monitoring. Additive Manufacturing, 35. p. 101325.

Tan, Yuanfu ORCID: 0009-0006-0251-7144, Ali, Mubasher ORCID: 0000-0001-8226-6395, Lin, Feng ORCID: 0000-0003-0501-2249, Su, Zhou, Liao, Wei-Hsin ORCID: 0000-0001-7221-5906 and Wong, Hay ORCID: 0000-0003-1717-2653 (2024) Study on laser spot size measurement by scanning-slit method based on back-injection interferometry. Optics & Laser Technology, 172. p. 110472.