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Number of items: 6.


Rossi, Daniele, Tenentes, Vasileios, Yang, Sheng, Khursheed, Saqib and Al-Hashimi, Bashir M
(2017) Aging Benefits in Nanometer CMOS Designs. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 64 (3). 324 - 328.


Tenentes, Vasileios, Rossi, Daniele, Yang, Sheng, Khursheed, S, Al-Hashimi, BM and Gunn, Steve R
(2017) Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure. IEEE Transactions on Very Large Scale Integration Systems, 25 (4). 1397 - 1407.


Tenentes, Vasileios, Khursheed, Saqib, Rossi, Daniele, Yang, Sheng and Al-Hashimi, Bashir M
(2015) DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 34 (12). 2013 - 2024.


Yi, Xinping ORCID: 0000-0001-5163-2364, Yang, Sheng, Gesbert, David and Kobayashi, Mari
(2014) The Degrees of Freedom Region of Temporally Correlated MIMO Networks With Delayed CSIT. IEEE Transactions on Information Theory, 60 (1). 494 - 514.


Rossi, Daniele, Tenentes, Vasileios, Yang, Sheng, Khursheed, Saqib and Al-Hashimi, Bashir M
(2016) Reliable Power Gating With NBTI Aging Benefits. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 24 (8). 2735 - 2744.


Yang, Sheng, Khursheed, Saqib, Al-Hashimi, Bashir M, Flynn, David and Idgunji, Sachin
(2011) Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 30 (12). 1773 - 1785.

This list was generated on Thu May 7 14:08:51 2020 BST.