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Fang, YX, Zhao, C, Mitrovic, IZ 
ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Yang, L and Zhao, CC
(2019)
Bias-stress stability and radiation response of solution-processed AlOx dielectrics investigated by on-site measurements.
Microelectronic Engineering.