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Shen, ZJ, Zhao, C, Zhao, CZ, Mitrovic, IZ 
ORCID: 0000-0003-4816-8905, Yang, L, Xu, WY, Lim, EG ORCID: 0000-0003-0199-7386, Luo, T and Huang, YB
(2019)
Al/GO/Si/Al RRAM with Solution-processed GO dielectric at Low Fabrication Temperature.
In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2019-4-1 - 2019-4-3, Grenoble, France.
Fang, YX, Zhao, C, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Yang, L and Zhao, CZ
(2019)
Bias-stress stability and radiation response of solution-processed AlOx dielectrics investigated by on-site measurements.
In: Insulating Films on Semiconductors, INFOS 2019, 2019-6-30 - 2019-7-3, Clare College, University of Cambridge, UK.
Cao, YX, Zhao, C, Liu, ZJ, Chen, XP, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Liu, YN, Yang, L, van Zalinge, H ORCID: 0000-0003-0996-1281 and Zhao, CZ
(2022)
Bionic artificial synaptic floating gate transistor based on MXene.
SOLID-STATE ELECTRONICS, 192.
p. 108257.
Zhao, TS, Zhao, C, Zhao, CZ, Xu, WY, Yang, L, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Lim, EG ORCID: 0000-0003-0199-7386 and Yu, SC
(2019)
Eco-Friendly, Low-temperature Solution-processed InO/AlO Thin-film Transistor with Li-incorporation.
In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2019-4-1 - 2019-4-3, Grenoble, France.
Mu, Y, Zhao, CZ, Lu, Q, Zhao, C, Qi, Y, Lam, S, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Taylor, S ORCID: 0000-0002-2144-8459 and Chalker, PR ORCID: 0000-0002-2295-6332
(2017)
Effects of biased irradiation on charge trapping in HfO<inf>2</inf> dielectric thin films.
In: INTERNATIONAL CONFERENCE “FUNCTIONAL ANALYSIS IN INTERDISCIPLINARY APPLICATIONS” (FAIA2017).
Liu, QH, Zhao, C, Zhao, CZ, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Xu, WY, Yang, L, Lim, EG ORCID: 0000-0003-0199-7386, Wang, QN, Wei, YL et al (show 1 more authors)
(2019)
Fully Solution-Processed Sodium Doped ZnO Thin-Film Transistors via a Low-Temperature Aqueous Route.
In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2019-4-1 - 2019-4-3, Grenoble, France.
Qi, YF, Zhao, CZ, Zhao, C, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Xu, WY, Yang, L, Shen, ZJ and He, JH
(2019)
Improved Resistive Switching Behavior in Solution-processed AlOx based RRAM.
In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2019-4-1 - 2019-4-3, Grenoble, France.
Lu, Q, Mu, Y, Zhao, Y, Zhao, CZ, Taylor, S ORCID: 0000-0002-2144-8459 and Chalker, PR
(2017)
Investigation of the electrical performance of hfo(2) dielectrics deposited on passivated germanium substrates.
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Mu, Y, Zhao, CZ, Qi, Y, Lam, S, Zhao, C, Lu, Q, Cai, Y, Mitrovic, IZ, Taylor, S and Chalker, PR
(2016)
Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 372.
14 - 28.
ISSN 0168-583X
Wang, QN, Zhao, C, Liu, W, Mitrovic, IZ ORCID: 0000-0003-4816-8905, van Zalinge, H ORCID: 0000-0003-0996-1281, Liu, YN and Zhao, CZ
(2022)
Synaptic transistors based on transparent oxide for neural image recognition.
SOLID-STATE ELECTRONICS, 194.
p. 108342.
Fang, YX, Xu, WY, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Yang, L, Zhao, C and Zhao, CZ
(2021)
An environmentally friendly solution-processed ZrLaO gate dielectric for large-area applications in the harsh radiation environment.
In: 2021 International Conference on IC Design and Technology (ICICDT), 2021-9-15 - 2021-9-17.