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Zurauskaite, L, Jones, L ORCID: 0000-0002-4654-3882, Dhanak, VR, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hellstrom, PE and Ostling, M
(2018) Investigation of Tm(2)O(3)( )as a Gate Dielectric for Ge MOS Devices. SIGE, GE, AND RELATED COMPOUNDS: MATERIALS, PROCESSING, AND DEVICES 8, 86 (7). 67 - 73.

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