Efficient test compaction for combinational circuits based on Fault detection count-directed clustering



El-Maleh, A and Khursheed, S
(2007) Efficient test compaction for combinational circuits based on Fault detection count-directed clustering. IET COMPUTERS AND DIGITAL TECHNIQUES, 1 (4). 364 - 368.

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Item Type: Article
Depositing User: Symplectic Admin
Date Deposited: 07 Sep 2015 08:29
Last Modified: 26 Apr 2022 09:14
DOI: 10.1049/iet-cdt:20070004
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/2024270