El-Maleh, A and Khursheed, S
(2007)
Efficient test compaction for combinational circuits based on Fault detection count-directed clustering.
IET COMPUTERS AND DIGITAL TECHNIQUES, 1 (4).
364 - 368.
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| Item Type: | Article |
|---|---|
| Depositing User: | Symplectic Admin |
| Date Deposited: | 07 Sep 2015 08:29 |
| Last Modified: | 26 Apr 2022 09:14 |
| DOI: | 10.1049/iet-cdt:20070004 |
| Related URLs: | |
| URI: | https://livrepository.liverpool.ac.uk/id/eprint/2024270 |
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