El-Maleh, A and Khursheed, S
(2007)
Efficient test compaction for combinational circuits based on Fault detection count-directed clustering.
IET COMPUTERS AND DIGITAL TECHNIQUES, 1 (4).
364 - 368.
![]() |
Text
04271379.pdf - Unspecified Access to this file is embargoed until Unspecified. Download (104kB) |
Item Type: | Article |
---|---|
Depositing User: | Symplectic Admin |
Date Deposited: | 07 Sep 2015 08:29 |
Last Modified: | 26 Apr 2022 09:14 |
DOI: | 10.1049/iet-cdt:20070004 |
Related URLs: | |
URI: | https://livrepository.liverpool.ac.uk/id/eprint/2024270 |
Dimensions
Altmetric
Share
CORE (COnnecting REpositories)