Efficient test compaction for combinational circuits based on Fault detection count-directed clustering

El-Maleh, A and Khursheed, S (2007) Efficient test compaction for combinational circuits based on Fault detection count-directed clustering. IET COMPUTERS AND DIGITAL TECHNIQUES, 1 (4). pp. 364-368.

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Abstract

Test compaction is an effective technique for reducing test data volume and test application time. The authors present a new static test compaction technique based on test vector decomposition and clustering. Test vectors are decomposed and clustered for faults in an increasing order of faults detection count. This clustering order gives more degree of freedom and results in better compaction. Experimental results demonstrate the effectiveness of the proposed approach in achieving higher compaction in a much more efficient CPU time than the previous clustering-based test compaction approaches. © The Institution of Engineering and Technology 2007.

Item Type:	Article
Depositing User:	Symplectic Admin
Date Deposited:	07 Sep 2015 08:29
Last Modified:	16 Dec 2022 02:27
DOI:	10.1049/iet-cdt:20070004
Related URLs:	Author Publisher
URI:	https://livrepository.liverpool.ac.uk/id/eprint/2024270