Mitrovic, IZ ORCID: 0000-0003-4816-8905, Althobaiti, M, Weerakkody, AD, Sedghi, N ORCID: 0000-0002-2004-6159, Hall, S ORCID: 0000-0001-8387-1036, Dhanak, VR, Mather, S, Chalker, PR ORCID: 0000-0002-2295-6332, Tsoutsou, D, Dimoulas, A et al (show 4 more authors)
(2014)
Interface Engineering Routes for a Future CMOS Ge-based Technology.
DIELECTRICS FOR NANOSYSTEMS 6: MATERIALS SCIENCE, PROCESSING, RELIABILITY, AND MANUFACTURING, 61 (2).
pp. 73-88.
Text
IZM et al ECS 2014.pdf - Author Accepted Manuscript Download (734kB) |
Abstract
<jats:p>We present an overview study of two germanium interface engineering routes, firstly a germanate formation via La<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub> and Y<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub>, and secondly a barrier layer approach using Al<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub> and Tm<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub>. The interfacial composition, uniformity, thickness, band gap, crystallinity, absorption features and valence band offset are determined using X-ray photoelectron spectroscopy, ultra violet variable angle spectroscopic ellipsometry, and high resolution transmission electron microscopy. The correlation of these results with electrical characterization data make a case for Ge interface engineering with rare-earth inclusion as a viable route to achieve high performance Ge CMOS.</jats:p>
Item Type: | Article |
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Additional Information: | ## TULIP Type: Articles/Papers (Journal) ## |
Depositing User: | Symplectic Admin |
Date Deposited: | 07 Feb 2017 07:48 |
Last Modified: | 19 Jan 2023 07:20 |
DOI: | 10.1149/06102.0073ecst |
Related URLs: | |
URI: | https://livrepository.liverpool.ac.uk/id/eprint/3005406 |