Noise reduction in CCD measurements by improving the quality of dark-reference images

Heil, Tobias ORCID: 0000-0003-4458-7387 and Tatlock, Gordon J (2018) Noise reduction in CCD measurements by improving the quality of dark-reference images. MICROSCOPY, 67 (suppl_). i123-i132.

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Abstract

This publication is a systematic investigation of the effect the improvement of dark-reference images has on the resulting bright-field images. For this, data were acquired with three different charge-coupled device cameras attached to two different transmission electron microscopes. Multi-frame acquisitions and methods to correct x-ray noise are introduced and quantified as options to improve the dark-reference images. Furthermore, the influence of x-ray noise on transmission electron microscopy measurements is discussed and observations on its composition are shared.

Item Type:	Article
Uncontrolled Keywords:	transmission electron microscopy, CCD camera, noise reduction, cosmic rays, x-ray noise, dark reference
Depositing User:	Symplectic Admin
Date Deposited:	15 May 2018 10:49
Last Modified:	19 Jan 2023 06:33
DOI:	10.1093/jmicro/dfy006
Related URLs:	Author Publisher
URI:	https://livrepository.liverpool.ac.uk/id/eprint/3021313