An environmentally friendly solution-processed ZrLaO gate dielectric for large-area applications in the harsh radiation environment



Fang, YX, Xu, WY, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Yang, L, Zhao, C and Zhao, CZ
(2021) An environmentally friendly solution-processed ZrLaO gate dielectric for large-area applications in the harsh radiation environment. In: 2021 International Conference on IC Design and Technology (ICICDT), 2021-9-15 - 2021-9-17.

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Abstract

In this work, an eco-friendly aqueous solution-processed ZrLaO dielectric is demonstrated for large-area application in the harsh radiation environment. Appropriate La doping (10% La) into ZrOx could suppress the formation of Vo and improve the InOx/ZrLaO interface. The Zr0.9La0.1Oy thin films remained stable under 144 krad (SiO2) gamma-ray irradiation, no distinct composition variation or property degradation were observed. The resistor-loaded inverter based on InOx/Zr0.9La0.1Oy TFT demonstrated full swing characteristics with a gain of 13.3 at 4 V and remained 91% gain after 103 krad (SiO2) irradiation.

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Uncontrolled Keywords: Gate dielectric, inverter, radiation hardness, Solution-process, ZrLaO
Divisions: Faculty of Science and Engineering > School of Electrical Engineering, Electronics and Computer Science
Faculty of Science and Engineering > School of Physical Sciences
Depositing User: Symplectic Admin
Date Deposited: 12 Apr 2023 09:35
Last Modified: 27 Apr 2024 16:03
DOI: 10.1109/ICICDT51558.2021.9626540
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3169538