Real-time and on-site gamma-ray radiation response testing system for semiconductor devices and its applications

Mu, Yifei, Zhao, Ce Zhou, Qi, Yanfei, Lam, Sang, Zhao, Chun, Lu, Qifeng, Cai, Yutao, Mitrovic, Ivona Z ORCID: 0000-0003-4816-8905, Taylor, Stephen ORCID: 0000-0002-2144-8459 and Chalker, Paul R ORCID: 0000-0002-2295-6332 (2016) Real-time and on-site gamma-ray radiation response testing system for semiconductor devices and its applications. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 372. 14 - 28.

Text Real time radiation response testing system_draft (3).docx - Accepted Version Download (1MB)

Item Type:	Article
Uncontrolled Keywords:	On-site radiation response, Real-time I-V/C-V test, High-kappa dielectrics, Total-dose induced defects, HfO2
Depositing User:	Symplectic Admin
Date Deposited:	30 Aug 2017 13:42
Last Modified:	09 Jan 2021 08:33
DOI:	10.1016/j.nimb.2016.01.035
Related URLs:	Author
URI:	https://livrepository.liverpool.ac.uk/id/eprint/3000962

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• Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications. (deposited 08 Apr 2016 10:12)
  • Real-time and on-site gamma-ray radiation response testing system for semiconductor devices and its applications. (deposited 30 Aug 2017 13:42) [Currently Displayed]