Real-time and on-site gamma-ray radiation response testing system for semiconductor devices and its applications



Mu, Yifei, Zhao, Ce Zhou, Qi, Yanfei, Lam, Sang, Zhao, Chun, Lu, Qifeng, Cai, Yutao, Mitrovic, Ivona Z ORCID: 0000-0003-4816-8905, Taylor, Stephen ORCID: 0000-0002-2144-8459 and Chalker, Paul R ORCID: 0000-0002-2295-6332
(2016) Real-time and on-site gamma-ray radiation response testing system for semiconductor devices and its applications. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 372. 14 - 28.

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Item Type: Article
Uncontrolled Keywords: On-site radiation response, Real-time I-V/C-V test, High-kappa dielectrics, Total-dose induced defects, HfO2
Depositing User: Symplectic Admin
Date Deposited: 30 Aug 2017 13:42
Last Modified: 09 Jan 2021 08:33
DOI: 10.1016/j.nimb.2016.01.035
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3000962

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