Mu, Yifei, Zhao, Ce Zhou, Qi, Yanfei, Lam, Sang, Zhao, Chun, Lu, Qifeng, Cai, Yutao, Mitrovic, Ivona Z ORCID: 0000-0003-4816-8905, Taylor, Stephen
ORCID: 0000-0002-2144-8459 and Chalker, Paul R
ORCID: 0000-0002-2295-6332
(2016)
Real-time and on-site gamma-ray radiation response testing system for semiconductor devices and its applications.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 372.
14 - 28.
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Real time radiation response testing system_draft (3).docx - Accepted Version Download (1MB) |
Item Type: | Article |
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Uncontrolled Keywords: | On-site radiation response, Real-time I-V/C-V test, High-kappa dielectrics, Total-dose induced defects, HfO2 |
Depositing User: | Symplectic Admin |
Date Deposited: | 30 Aug 2017 13:42 |
Last Modified: | 09 Jan 2021 08:33 |
DOI: | 10.1016/j.nimb.2016.01.035 |
Related URLs: | |
URI: | https://livrepository.liverpool.ac.uk/id/eprint/3000962 |
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Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications. (deposited 08 Apr 2016 10:12)
- Real-time and on-site gamma-ray radiation response testing system for semiconductor devices and its applications. (deposited 30 Aug 2017 13:42) [Currently Displayed]
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