Extraction of the sub-band gap density of states of Nb doped ZnO thin film transistors using C-V measurements



Shaw, A, Jin, JD, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Wrench, JS and Chalker, PR ORCID: 0000-0002-2295-6332
(2017) Extraction of the sub-band gap density of states of Nb doped ZnO thin film transistors using C-V measurements. Microelectronic Engineering, 178. 213 - 216.

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Item Type: Article
Depositing User: Symplectic Admin
Date Deposited: 18 May 2017 12:12
Last Modified: 09 Jan 2021 06:54
DOI: 10.1016/j.mee.2017.05.043
URI: https://livrepository.liverpool.ac.uk/id/eprint/3007477

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