Shaw, A, Jin, JD, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Wrench, JS and Chalker, PR ORCID: 0000-0002-2295-6332
(2017)
Extraction of the sub-band gap density of states of Nb doped ZnO thin film transistors using C-V measurements.
Microelectronic Engineering, 178.
pp. 213-216.
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Official URL: http://dx.doi.org/10.1016/j.mee.2017.05.043
Item Type: | Article |
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Depositing User: | Symplectic Admin |
Date Deposited: | 18 May 2017 12:12 |
Last Modified: | 19 Jan 2023 07:04 |
DOI: | 10.1016/j.mee.2017.05.043 |
Related URLs: | |
URI: | https://livrepository.liverpool.ac.uk/id/eprint/3007477 |
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Extraction of the sub-band gap density of states of Nb doped ZnO thin film transistors using C-V measurements. (deposited 27 Apr 2017 06:20)
- Extraction of the sub-band gap density of states of Nb doped ZnO thin film transistors using C-V measurements. (deposited 18 May 2017 12:12) [Currently Displayed]
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