Sawangsri, K, Das, P ORCID: 0000-0003-1147-6541, Supardan, SN, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Mahapatra, R, Chakraborty, AK, Treharne, R, Gibbon, J ORCID: 0000-0003-1548-0791, Dhanak, VR et al (show 2 more authors)
(2017)
Experimental band alignment of Ta2O5/GaN for MIS-HEMT applications.
Microelectronic Engineering, 178.
pp. 178-181.
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Manuscript_Sawangsri et al-revised-accepted copy.docx - Author Accepted Manuscript Download (5MB) |
Official URL: http://dx.doi.org/10.1016/j.mee.2017.04.010
Item Type: | Article |
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Depositing User: | Symplectic Admin |
Date Deposited: | 27 Apr 2017 06:23 |
Last Modified: | 19 Jan 2023 07:05 |
DOI: | 10.1016/j.mee.2017.04.010 |
Related URLs: | |
URI: | https://livrepository.liverpool.ac.uk/id/eprint/3007147 |
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